µsprint – Confocal high speed metrology
µsprint hp-opc 3000
The 3D metrology system µsprint hp-opc 3000 is specialized for the inspection of probe cards in wafer production. Read more
With more than one million measurements per second, μsprint sensor is the ideal tool for high-speed in-line production control. Read more
µsprint hp-hsi 2000
The 3D inspection system µsprint hp-hsi 2000 is ideally suited for measurement tasks in the semicoductor industry. Read more
At a highspeed-scanning rate the compact 3D inspection system measures the topograpghy of various surfaces with highest precision.