Press Release

Optical roughness metrology for implants

The measurement system µsurf of NanoFocus, being equipped with a rotation axis, specially customized implant holding devices, automation software and a multisensor measuring head, is optimized for surface measurements on implants. Leading manufacturers of endoprostheses use the optical confocal measuring technology of NanoFocus for surface analysis, production control and product development. 

The measurement system µsurf is equally applicable in testing and development laboratories as well as for automated series measurements near the production line.
Implants can be fixated in the clamping device on the rotations axis. By means of barcode-scanning the individual product is identified and a predefined measurement recipe is retrieved. After an automated distance measurement, the measuring system moves to the specified positions and measures the test positions without any interference by the user.

Accurately reproducing the profile of ultrafine roughness structures of metal, plastic of ceramic surfaces represents a central quality criterion of the confocal measurement technology developed by NanoFocus. Surface structures are captured areally with highest repeatability. Roughness evaluations (s-parameter) according to ISO 25178 are possible as well as comparative analyses in the 3D representation analogous to a SEM. For 2D roughness evaluations line profiles can be extracted.

Measurement results can be directly transferred to pre-defined evaluation protocols. They can also be exported to further relevant software, such as qs-STAT, Matlab or SAP data bases, via various data interfaces. An industry-specific rights management and an integrated audit-trail guarantee unmanipulated measurement results in compliance with certification requirements according to FDA regulations.

Visit us at Compamed: Hall 8A/Booth H19

A rotary axis, special implant holding devices, powerful
automation software and a multisensor measuring head
make µsurf the ideal measuring system for implant surface analysis.

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