News

16.June 2016
 - 
Press Release

Successful product launch

New process tool for the inspection of probe cards generates positive response from semiconductor industry[more]

20.May 2016
 - 
Press Release

NanoFocus AG introduces new inspection system for semiconductors industry

Optical, fast, and high-precision: µsprint hp-opc 3000 revolutionizes the inspection process of probe cards in wafer production[more]

17.November 2015
 - 
Press Release, Corporate News

Breitmeier Messtechnik GmbH becomes subsidiary of NanoFocus

The specialist for automated production metrology expands the customer and product portfolio of NanoFocus AG[more]

10.February 2015
 - 
Press Release

Automated optical surface metrology for industrial application

Control 2015: Intelligent quality assurance with NanoFocus confocal 3D measuring systems[more]

17.November 2014
 - 
Press Release

NanoFocus in medical technology: Interview with Jürgen Valentin at Compamed 2014

In medical technology, there are very high requirements regarding the quality of the products, since they are deployed for support and analysis of the human body or even as an implant. To ensure a reliable functionality, material, design and especially the characteristics of the product...[more]

02.October 2014
 - 
Press Release

Optical roughness metrology for implants

The measurement system µsurf of NanoFocus, being equipped with a rotation axis, specially customized implant holding devices, automation software and a multisensor measuring head, is optimized for surface measurements on implants. Leading manufacturers of endoprostheses use the optical confocal...[more]

29.August 2014
 - 
Press Release

NanoFocus AG celebrates 20th company anniversary

20 years of international innovation in modern surface metrology [more]

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